We are delighted to announce that recent work from our lab “Operational cycling voltage dependence of the oxygen vacancy distribution in 6nm Hf₀.₅Zr₀.₅O₂ ferroelectric capacitors” has been published in Applied Physics Letters.

This study investigates the influence of the operational cycling voltage on the oxygen-vacancy distribution in ultrathin HZO capacitors. Using synchrotron-based hard X-ray photoelectron spectroscopy (HAXPES), it explores the evolution of oxygen vacancies during electrical cycling and their role in the wake-up and fatigue behaviour of ferroelectric HZO.

The results provide new insights into the relationship between oxygen-vacancy redistribution, electrical cycling conditions, and ferroelectric device performance.

Read more: https://doi.org/10.1063/5.0333738